Showing results: 286 - 300 of 473 items found.
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IIB-3910-VME-2C -
Western Avionics Ltd.
The IIB-3910-VME-2C is a 6U single VME slot intelligent interface card providing complete STANAG 3838 andSTANAG 3910 test, simulation and bus analysis capability, for two 3838 dual redundant and two 3910 buses, which support optical dual redundant and electrical single redundant 3910 protocols.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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9U VME430 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation CERN VME430 compliant VME crates for large size 9Ux400mm cards. Designed for applications in nuclear and high-energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Intellitech Corp.
The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
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NX Hipot+ -
Dynalab Test Systems, Inc.
* 50 to 1500VDC Hipot Testing * 50 to 1000VAC (optional) * Expandable to 1024 test points * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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T300 ButtonTile™ -
Celadon
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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SV Probe, Inc.
SV TCL also has the capability to emulate the testing environment with our probe card analyzers including newly installed direct dock analyzers in the United States, Taiwan and Vietnam. SV TCL is dedicated to continuous product improvement so that we can provide our customers the latest and most innovative test solutions.
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K8217B -
Keysight Technologies
Cover-Extend Technology (CET) extends the measurement capability of VTEP or nanoVTEP into powered testing by using the Boundary Scan output cell to test the connectors and socket signal pins. This capability extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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GX3700 -
Marvin Test Solutions, Inc.
The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Pickering Interfaces Ltd.
These 8x9 RF Switch Cards are suitable for switching frequencies up to 500MHz. Available in either 50 or 75 versions with SMB coaxial connectors. These switch cards are intended for the easy construction of high-performance bidirectional matrix switching systems. Automatic isolation switches are located on all coaxial connections, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
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9U VME430 6021 -
W-IE-NE-R, Plein & Baus GmbH
WIENER VME 6021 crate series is the newest generation of generation CERN VME430 compliant VME crates for large size 9Ux400mm cards. Designed for applications in nuclear and high energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Alpha Automation Inc.
This machine is used to test back planes used in telecommunications central stations. An operator loads a completed point to point wired back plane onto a retractable shelf on the front of the tester. Table continues and the disk falls through a hole into the bin. The shelf is pushed back into the machine where it is held in place by pneumatic operated clamps. Then a series of pneumatic cylinders sequentially insert a test card into each location in the back plane. A remote instrument performs a complete point to point continuity, short and hi pot test on all connections in the back plane.
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Rohde & Schwarz GmbH & Co. KG
Rohde & Schwarz offers automated compliance test solution of PCI Express Gen 1.1, 2.0 and 3.0 interfaces. The test wizard of the Rohde & Schwarz ScopeSuite compliance test software guides the user via illustrated step-by-step instructions. The option supports add-in card and system motherboard testing. It is based on the PCI-SIG standard post processing analysis software and utilizes PCI-SIG test fixtures. A configurable test report documents the test results.
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KT7201 -
Ketai instrument (kunshan) Ltd.
● 3 1/2 digits 1999 count● 20 range in 6 functions● Backlight display is easy to read under any light condition● Low battery indication● Overload protection● DC/AC voltage measurement up to 500V● DC current measurement up to 10A● Resistance measurement up to 2MΩ● Fuse: F200mA/250V, F10A/250V● Transistor polarity tests● Accessories included: 9V battery, elastomer boot, test leads, English manual, gift box or blister card
